Analog Circuit Design for Process Variation-Resilient by Marvin Onabajo

By Marvin Onabajo

This ebook describes a number of thoughts to handle variation-related layout demanding situations for analog blocks in mixed-signal systems-on-chip. The equipment provided are effects from contemporary study works concerning receiver front-end circuits, baseband clear out linearization, and knowledge conversion. those circuit-level suggestions are defined, with their relationships to rising system-level calibration methods, to song the performances of analog circuits with electronic suggestions or keep an eye on. assurance additionally encompasses a technique to make the most of on-chip temperature sensors to degree the sign strength and linearity features of analog/RF circuits, as verified via attempt chip measurements.

  • Describes numerous variation-tolerant analog circuit layout examples, together with from RF front-ends, high-performance ADCs and baseband filters;
  • Includes integrated trying out suggestions, associated with present business trends;
  • Balances digitally-assisted functionality tuning with analog functionality tuning and mismatch aid approaches;
  • Describes theoretical techniques in addition to experimental effects for try out chips designed with variation-aware techniques.

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4 also visualizes the equivalent capacitive load seen at the V1+ and V1- inputs, where Cpt represents the effective gate-to-ground(AC) capacitance from transistor parasitic capacitances. With this configuration, the gate voltages are: VG+/- = (CFG1/Ctotal)V1+/- ? (CFG2/ Ctotal)V2+/-, where Ctotal & CFG1 ? CFG2 when Cpt is negligible. It follows that the attenuation factors in Fig. 3 are: CFG1/Ctotal = k1 and CFG2/Ctotal = (Ctotal - CFG1)/Ctotal = 1 – k1. 1–1% using proper layout techniques. 3 Circuit-Level Design Considerations 39 Fig.

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Uchida, K. Tsunokuni, A novel wafer-yield PDF model and verification with 90–180 nm SOC chips. IEEE Trans. Semicond. Manuf. 21(4), 585–591 (2008) 7. A. Zivkovic, F. van der Heyden, G. Gronthoud, F. de Jong, Analog test bus infrastructure for RF/AMS modules in core-based design, in Proceedings of 13th European Test Symposium, May 2008, pp. 27–32 28 2 Process Variation Challenges and Solutions Approaches 8. K. Agarwal, J. Hayes, S. Nassif, Fast characterization of threshold voltage fluctuation in MOS devices.

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